Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles - NASA/ADS

Now on home page

References (12)

Co-Reads

Volume Content

Graphics

Export Citation

NASA/ADS

Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles

Publication:: Philosophical Magazine
Pub Date:: 2007
DOI:: 10.1080/14786430701203184
Bibcode:: 2007PMag...87.2427S

full text sources

Publisher

|