Atomic layer epitaxy of MnAs on GaAs(0 0 1)
Abstract
Atomic layer epitaxy (ALE) of MnAs on GaAs(0 0 1) has been investigated using bismethylcyclopentadienylmanganese (CH 3C 5H 4) 2Mn and trisdimethylaminoarsine As[N(CH 3) 2] for manganese and arsenic precursors, respectively. The α-MnAs layer of "type B" orientation was successfully grown by an alternative source supply with a wide growth temperature range from 320 to 500 °C. The grown layer showed a smooth surface morphology, reflecting the self-limiting growth. The decreased growth rate was observed below 350 °C, which was caused by the decreased reaction rate of As[N(CH 3) 2] 3 on the growing surface. A clear self-limiting mechanism was realized at higher growth temperatures but the saturation thickness was 9.5×10 -2 nm/cycle, which was attributed to the formation of a stable surface-reconstruction of manganese stabilized surface.
- Publication:
-
Journal of Crystal Growth
- Pub Date:
- January 2007
- DOI:
- 10.1016/j.jcrysgro.2006.10.120
- Bibcode:
- 2007JCrGr.298...90O
- Keywords:
-
- 81.05.Ea;
- 81.15.-z;
- 81.15.Kk;
- III-V semiconductors;
- Methods of deposition of films and coatings;
- film growth and epitaxy;
- Vapor phase epitaxy;
- growth from vapor phase