Far-field subdiffraction optical microscopy using metamaterial crystals: Theory and simulations
Abstract
Here we suggest and explore theoretically an idea for a far-field scanless optical microscopy with a subdiffraction resolution. We exploit the special dispersion characteristics of an anisotropic metamaterial crystal that is obliquely cut at its output plane, or has a curved output surface, in order to map the input field distribution onto the crystal’s output surface with a compressed angular spectrum, resulting in a “magnified” image. This can provide a far-field imaging system with a resolution beyond the diffraction limits while no scanning is needed.
- Publication:
-
Physical Review B
- Pub Date:
- August 2006
- DOI:
- 10.1103/PhysRevB.74.075103
- Bibcode:
- 2006PhRvB..74g5103S
- Keywords:
-
- 78.67.Pt;
- 07.60.Pb;
- 42.79.-e;
- 78.20.-e;
- Multilayers;
- superlattices;
- Conventional optical microscopes;
- Optical elements devices and systems;
- Optical properties of bulk materials and thin films