Bonding Transition in SiO2 Glass at High Pressures: Applications to SiO2 Liquid in Earth's Interior

SiO2 and MgSiO3 liquids are two major components in the magma deep inside the Earth. Knowledge of their electronic bonding characters at high pressures is essential to understanding the complex properties of the materials in the melts. The nature of pressure-induced bonding change in amorphous SiO2 has been an intriguing and long-standing problem that remains to be further understood. For example, previous infrared and X-ray diffraction studies suggested that a continuous transformation from the four- to six-fold coordinated silicon occurred in amorphous SiO2 at high pressures, whereas separate optical Raman studies attributed to a pressure-induced shift in the local ring statistics and a breakdown in the intermediate-range order. Here we have studied the oxygen near K-edge spectra of SiO2 glass to 51 GPa obtained using X-ray Raman scattering in a diamond-anvil cell, which directly probes the electronic bonding character of the sample. Our results provide conclusive evidence for a pressure-induced electronic bonding transition in SiO2 glass at high pressures. Although a progressive decrease in the mean Si-O-Si angle in the SiO4 tetrahedra is believed to be responsible for the irreversible densification in SiO2 glass at high pressures, our observed transition is reversible upon decompression. A similar transformation is also expected to occur in silicate glasses and melts, which will most definitely alter their physical, mechanical and transport properties in the magma chamber deep in the Earth's interior. This work was performed under the auspices of the U.S. DOE by UC/LLNL under Contract W-7405-Eng-48.