Secondary ion emission from CO2-H2O ice irradiated by energetic heavy ions: Part II: Analysis-search for organic ions
Abstract
Secondary ion mass spectrometry is used to investigate ion emission from a frozen-gas mixture of CO2 and H2O (T = 80-90 K) bombarded by MeV nitrogen ions and by 252Cf fission fragments. The aim of the experiment is to detect organic molecules, produced in the highly excited material around the nuclear track, which appear as ions in the flux of sputtered particles. Part I of the present work [L.S. Farenzena, V.M. Collado, C.R Ponciano, E.F. da Silveira, K. Wien. Int. J. Mass Spectrom. 243 (2005) 85-93] described the method and presented the time-of-flight mass spectra; a list of the CO2 specific and H2O specific reaction products was provided. In Part II, the peaks of the TOF mass spectra are analyzed. Projectile-ice direct coulomb interaction leads to the production in the track of the H+, C+, O+, O2+, CO+ and CO2+ primarily ions, which react in the highly energized nuclear track plasma mainly with CO2 and H2O or H2CO3. The positive molecular hybrid ions formed are identified as organic species like COH+, COOH+, CHn = 1-3+, Hn = 1,2COOH+ and cluster ions. Similarly, the negative primarily ions O- and OH- formed by electron capture produce negative hybrid ions such as (CO2)nOH-, the four ions (CO4Hm = 0-3)- and the corresponding cluster ions. By far, most of the molecular ions have been formed by one-step reactions; exceptions are eventually the CO4Hm- ions created by a reaction between CO3- and water molecules. An intense mass line corresponding to HCO3+ has been observed, but not the one due to formaldehyde ion. Weak signals of ionic ketene, hydrogen peroxide and carbonic acid were seen.
- Publication:
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International Journal of Mass Spectrometry
- Pub Date:
- June 2005
- DOI:
- Bibcode:
- 2005IJMSp.244...41P
- Keywords:
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- Secondary ions;
- Condensed gases;
- CO2-H2O ice;
- Electronic sputtering;
- TOF SIMS;
- PDMS;
- Cluster desorption