Fault Testing for Reversible Circuits
Abstract
Applications of reversible circuits can be found in the fields of lowpower computation, cryptography, communications, digital signal processing, and the emerging field of quantum computation. Furthermore, prototype circuits for lowpower applications are already being fabricated in CMOS. Regardless of the eventual technology adopted, testing is sure to be an important component in any robust implementation. We consider the test set generation problem. Reversibility affects the testing problem in fundamental ways, making it significantly simpler than for the irreversible case. For example, we show that any test set that detects all single stuckat faults in a reversible circuit also detects all multiple stuckat faults. We present efficient test set constructions for the standard stuckat fault model as well as the usually intractable cellfault model. We also give a practical test set generation algorithm, based on an integer linear programming formulation, that yields test sets approximately half the size of those produced by conventional ATPG.
 Publication:

arXiv eprints
 Pub Date:
 March 2004
 arXiv:
 arXiv:quantph/0404003
 Bibcode:
 2004quant.ph..4003P
 Keywords:

 Quantum Physics
 EPrint:
 30 pages, 8 figures. to appear in IEEE Trans. on CAD