Thin Films Analysis Using Photoelectron Spectroscopy
Abstract
Photoelectron spectroscopy has substantially contributed to the understanding of electronic structure of atoms, molecules and solids. Photoelectron spectroscopy using conventional X-ray or UV sources has proved to be advantageous by revealing the Electron Distribution Curves (EDC) of Solids. However in the last twenty years or so, the use of synchrotron radiation has become a more powerful source for carrying out photoelectron spectroscopy, with additional advantages due to its tunability to desired energy and polarization. This becomes very useful to understand electronic structure in thin films. In this article an overview of various analysis aspects of photoelectron spectroscopy using conventional and synchrotron radiation source are given.
- Publication:
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Physics and Technology of Thin Films, IWTF 2003
- Pub Date:
- June 2004
- DOI:
- Bibcode:
- 2004pttf.conf..129K