Determination of Ag domain populations on Cu(111) using directional Auger and directional elastic peak electron spectroscopies
The Auger signal and the intensity of elastically backscattered electrons were measured as a function of the incidence angle of the primary electron beam to find the crystalline structure of ultrathin Ag layers on the Cu(111) surface. Experimental profiles were compared with theoretical data obtained with the use of single scattering cluster (SSC) calculations for clean and covered Cu(111) . Auger scans for Ag MNN transition and elastic peak profiles exhibit intensity maxima corresponding to two mutually rotated Ag(111) domains. Different domain populations were found by an R-factor analysis, which can be rationalized by the miscut of the Cu(111) sample and the resulting step orientation.