Quantum ellipsometry using correlated-photon beams
Abstract
We report ellipsometric measurements made on semiconductor samples using photon-correlated beams produced by the process of spontaneous parametric down-conversion. Such a source yields higher accuracy than its quantum-limited conventional counterpart. We also show that our approach has the added advantage of not requiring an external reference sample for calibration.
- Publication:
-
Physical Review A
- Pub Date:
- August 2004
- DOI:
- 10.1103/PhysRevA.70.023801
- Bibcode:
- 2004PhRvA..70b3801T
- Keywords:
-
- 42.50.Lc;
- 42.25.Ja;
- 42.50.Dv;
- Quantum fluctuations quantum noise and quantum jumps;
- Polarization;
- Nonclassical states of the electromagnetic field including entangled photon states;
- quantum state engineering and measurements