Focused Ion Beam Milled CoPt Magnetic Force Microscopy Tips for High Resolution Domain Images Gao, L. ; Yue, L. P. ; Yokota, T. ; Skomski, R. ; Liou, S. H. ; Takahoshi, H. ; Saito, H. ; Ishio, S. Abstract Publication: IEEE Transactions on Magnetics Pub Date: July 2004 DOI: 10.1109/TMAG.2004.829173 Bibcode: 2004ITM....40.2194G