Mass spectrometric determination of partial pressures of ions in the saturated vapor over the NaF-Na3AlF6 system

Mass spectrometric determination of absolute partial pressures of basic charged species Na2F+ and AlF4- in the saturated vapor over the NaF-Na3AlF6 system (1:1 molar ratio) was carried out in the 974-1090 K temperature range. The ion pressures were 5-8 orders of magnitude lower than the pressures of basic molecular components NaAlF4 and NaF. Particular attention was given to the equality of device sensitivity constants for positive and negative ions. Absolute device calibration was carried out using the measured ion currents Na2F+ and AlF4- and the equilibrium constant of heterolytic dissociation available in the literature.