Total Negative Refraction in Real Crystals for Ballistic Electrons and Light
Abstract
It is found that there exists a category of material interfaces, readily available, that not only can provide total refraction (i.e., zero reflection) but can also give rise to amphoteric refraction (i.e., both positive and negative refraction) for electromagnetic waves in any frequency domain as well as for ballistic electron waves. These two unusual phenomena are demonstrated experimentally for the propagation of light through such an interface.
- Publication:
-
Physical Review Letters
- Pub Date:
- October 2003
- DOI:
- 10.1103/PhysRevLett.91.157404
- Bibcode:
- 2003PhRvL..91o7404Z
- Keywords:
-
- 78.20.Ci;
- 42.25.Gy;
- 73.40.-c;
- 73.50.-h;
- Optical constants;
- Edge and boundary effects;
- reflection and refraction;
- Electronic transport in interface structures;
- Electronic transport phenomena in thin films