Description of x-ray reflection and diffraction from periodical multilayers and superlattices by the eigenwave method
Abstract
The analytical solution of recurrent equations for amplitudes of electromagnetic field is found for description of x-ray reflection and diffraction from periodical multilayered media. The method proposed uses the Bloch eigenwaves approach for periodical structure, which reduces considerably the computer time required for simulation of diffracted/reflected x-ray intensity and, therefore, accelerates the fitting trial-and-error procedure for sample model parameters. Numerical examples and fit results for experimental x-ray data are provided to demonstrate the effectiveness of method. A new parameter describing the fluctuation of superlattice period is introduced and its influence on experimental data interpretation is discussed.
- Publication:
-
Physical Review B
- Pub Date:
- December 2003
- DOI:
- 10.1103/PhysRevB.68.235307
- Bibcode:
- 2003PhRvB..68w5307F
- Keywords:
-
- 68.65.Cd;
- 61.10.Kw;
- Superlattices;
- X-ray reflectometry