Quantum interference in a one-dimensional silicon nanowire
Abstract
We study electronic transport within a lithographically defined silicon nanowire for zero and finite bias. The 10-nm wide and 500-nm long nanowire is fabricated by advanced electron-beam lithographic techniques. Transport experiments reveal clear quantum size effects in the conduction through the wire. Energy quantization within the wire leads to a shift in conduction threshold. Quantum interference effects cause an oscillatory pattern in the conductance. At low source-drain bias, transport is dominated by shallow tunneling barriers. At higher bias, additional nanowire modes are found to contribute to the conductance.
- Publication:
-
Physical Review B
- Pub Date:
- August 2003
- DOI:
- 10.1103/PhysRevB.68.075311
- Bibcode:
- 2003PhRvB..68g5311T
- Keywords:
-
- 73.40.Qv;
- 73.63.Nm;
- 71.10.Pm;
- Metal-insulator-semiconductor structures;
- Quantum wires;
- Fermions in reduced dimensions