A Newly Developed Fib System For Tem Specimen Preparation Kamino, T. ; Yaguchi, T. ; Kuroda, Y. ; Hashimoto, T. ; Ohnishi, T. ; Ishitani, T. ; Umemura, K. ; Asayama, K. Abstract Publication: Microscopy and Microanalysis Pub Date: August 2002 DOI: 10.1017/S1431927602101565 Bibcode: 2002MiMic...8S..48K