Electrostatic charging artefacts in Lorentz electron tomography of MFM tip stray fields
Abstract
Using the technique of differential phase contrast (DPC) Lorentz electron microscopy, the magnetic stray field distribution from magnetic force microscopy (MFM) tips can be calculated in a plane in front of the tip using tomographic reconstruction techniques. Electrostatic charging of the tip during DPC imaging can significantly distort these field reconstructions. Using a simple point charge model, this paper illustrates the effect of electrostatic charging of the sample on the accuracy of tomographic field reconstructions. A procedure for separating electrostatic and magnetic effects is described, and is demonstrated using experimental tomographic data obtained from a modified MFM tip.
- Publication:
-
Journal of Physics D Applied Physics
- Pub Date:
- May 2001
- DOI:
- 10.1088/0022-3727/34/9/307
- Bibcode:
- 2001JPhD...34.1326S