Current instabilities in GaN-based devices Daumiller, I. ; Theron, D. ; Gaquiere, C. ; Vescan, A. ; Dietrich, R. ; Wieszt, A. ; Leier, H. ; Vetury, R. ; Mishra, U. K. ; Smorchkova, I. P. ; Keller, S. ; Nguyen, C. ; Kohn, E. Abstract Publication: IEEE Electron Device Letters Pub Date: February 2001 DOI: 10.1109/55.902832 Bibcode: 2001IEDL...22...62D