A method for the experimental determination of the net atomic charge via X-ray photoemission spectroscopy
A method for the experimental determination of the net charge distribution over the atoms in a large class of compounds is described. The method is based on X-ray photoemission spectroscopy and requires the determination of two core-level energies per constituting atomic species. Two special cases of large conceptual and practical interest are discussed: the silicon charge in CoSi2, Si1-xGex (0<=x<=0.3), SiC, Si3N4 and SiO2, and the aluminum charge in aluminum-doped zeolites.
Applied Physics A: Materials Science & Processing
- Pub Date:
- PACS: 33.60.Fy;