Event Pileup in Charge-coupled Devices
Abstract
The problem of event pileup in single-photon-counting CCD cameras (e.g., in the X-ray regime) is discussed, and a solution to the problem is proposed. The resulting pileup equation includes the effects of grade migration and presents itself as a nonlinear modification to the standard integral equation used by forward-folding spectral-fitting programs. The effectiveness of the model is demonstrated by its application to the moderately piled zeroth-order data obtained by the Chandra X-Ray Observatory for the quasar S5 0836+7104.
- Publication:
-
The Astrophysical Journal
- Pub Date:
- November 2001
- DOI:
- 10.1086/323488
- Bibcode:
- 2001ApJ...562..575D
- Keywords:
-
- Instrumentation: Detectors;
- Methods: Analytical;
- Methods: Data Analysis;
- X-Rays: General