Study on a new organic-complex thin film with electrical bistable properties using a scanning tunneling microscope
A new organic complex thin film of tetrathiofulvalene/m-nitrobenzylidene propanedinitrile (TTF/m-NBP) with electrical bistable properties has been fabricated by using a hot-wall deposition method. The films were analyzed by Fourier transform infrared (FTIR) spectroscopy and transmission electron microscope (TEM). Data recording experiments on the film were realized by applying voltage pulses between the scanning tunneling microscope (STM) tip and the substrate. The small recording dot was 1.2 nm in diameter. The width of the pulse voltage has influence upon the diameter of the recording marks. The current-voltage (I-V) curves of the film showed a conductive behavior for the recorded region, while a high resistance behavior for the unrecorded region. The possible conductive mechanism was also discussed.