Reflectance Measurements and Optical Constants in the Extreme Ultraviolet for Thin Films of Ion-Beam-Deposited SiC, Mo, Mg 2 Si, and InSb and of Evaporated Cr
Abstract
- Publication:
-
Applied Optics
- Pub Date:
- June 2000
- DOI:
- 10.1364/AO.39.002772
- Bibcode:
- 2000ApOpt..39.2772L