Structural perfection of GaN epitaxial layers according to x-ray diffraction measurements Kyutt, R. N. ; Ratnikov, V. V. ; Mosina, G. N. ; Shcheglov, M. P. Abstract Publication: Physics of the Solid State Pub Date: January 1999 DOI: 10.1134/1.1130722 Bibcode: 1999PhSS...41...25K