Focused Impedance Measurement (FIM): A New Technique with Improved Zone Localization
Abstract
- Publication:
-
Annals of the New York Academy of Sciences
- Pub Date:
- April 1999
- DOI:
- 10.1111/j.1749-6632.1999.tb09490.x
- Bibcode:
- 1999NYASA.873..408R