Terabit-per-square-inch data storage with the atomic force microscope
Abstract
An areal density of 1.6 Tbits/in.2 has been achieved by anodically oxidizing titanium with the atomic force microscope (AFM). This density was made possible by (1) single-wall carbon nanotubes selectively grown on an AFM cantilever, (2) atomically flat titanium surfaces on α-Al2O3 (1012), and (3) atomic scale force and position control with the tapping-mode AFM. By combining these elements, 8 nm bits on 20 nm pitch are written at a rate of 5 kbit/s at room temperature in air.
- Publication:
-
Applied Physics Letters
- Pub Date:
- November 1999
- DOI:
- 10.1063/1.125390
- Bibcode:
- 1999ApPhL..75.3566C
- Keywords:
-
- 75.50.Ss;
- 68.35.Bs;
- Magnetic recording materials;
- Structure of clean surfaces