Lateral force microscope and phase imaging of patterned thiol self-assembled monolayer using chemically modified tips
A hydrophobic/hydrophilic patterned thiol self-assembled monolayer (SAM) was formed on a gold-coated flat Si substrate. The patterned SAM was imaged by two modes of atomic force microscopy with Si tips and chemically modified tips. One is lateral force microscopy and the other is a phase mode. The two different domains on the sample were successfully mapped by both modes. Higher contrast of the images was obtained by using HOOC-terminated tips in both modes.
Applied Physics A: Materials Science & Processing
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