The adhesive force of a friction-transferred polytetrafluoroethylene (PTFE) film was mapped by using an atomic force microscope (AFM) system driven by custom software. The friction-transferred PTFE film, which was made by sliding a PTFE polymer rod on a heated glass, consisted of many PTFE ridges running parallel to the sliding direction on the glass surface. The adhesive force on the sample was derived from force curve measurement. A triangular wave amplified with a custom high-voltage amplifier was fed into the Z piezo of the AFM head through an AFM controller unit to obtain force curves while the AFM cantilever scanned a single line of the sample. The force curves both of the PTFE ridges and of the bare glass surface could be obtained by scanning the region perpendicular to the sliding direction. The deflection signal of the cantilever was sampled and stored in a computer through an AD converter. The adhesive force on the PTFE region was about half that on the glass surface. This difference was explained by the difference in capillary force of the surface water.
Applied Physics A: Materials Science & Processing
- Pub Date:
- PACS: 68.35