Electron beam induced small particle transformations: temperature
Abstract
Real time high resolution microscopy of Au, Ag and Pb particles on C and SiO substrates was performed to determine the role of the electron beam on the morphology transformations. The data conclusively rule out high temperature excursions in the small particles due to the beam.
- Publication:
-
Surface Science
- Pub Date:
- March 1996
- DOI:
- 10.1016/0039-6028(95)01037-8
- Bibcode:
- 1996SurSc.348L..67D