The resolution of the standard PIXE arrangement can be drastically improved by the use of the wavelength dispersive spectrometer (WDS). The arrangement with the plane crystal and the position sensitive detector was installed. Although the efficiency of the spectrometer is rather low due to the small solid angle (Δ Ω/4π= 4 × 10 -7), its advantages become very pronounced in the situation of overlapping of the adjacent characteristic lines. The spectrometer is used for the X-ray energy range from 3 to 10 keV, the soft X-rays being detected after evacuation of the crystal vacuum chamber. The resolution of the spectrometer is 15 eV at 5.9 keV. Up to now the set-up has been mainly used for the study of inner-shell atomic physics phenomena. The successful runs of the spectrometer have been performed to prove the applicability of the method for the elemental analysis.