A compact flat-crystal X-ray spectrometer for external beam PIXE measurements
Abstract
A wavelength dispersive system based on a flat crystal coupled to a CCD position-sensitive detector is described. The system, to be used in conjunction with an external beam facility for PIXE measurements, is particularly compact, easy to use, and has a useful energy range extending from about 4 to 13 keV. The performance of the system with respect to efficiency and energy resolution is studied as a function of different experimental conditions. Possible simple applications are briefly discussed.
- Publication:
-
Nuclear Instruments and Methods in Physics Research B
- Pub Date:
- January 1996
- Bibcode:
- 1996NIMPB.108..197M