Microstructure, electrical properties, and thermal stability of Al ohmic contacts to n-GaN Smith, L. L. ; Davis, R. F. ; Kim, M. J. ; Carpenter, R. W. ; Huang, Y. Abstract Publication: Journal of Materials Research Pub Date: September 1996 DOI: 10.1557/JMR.1996.0286 Bibcode: 1996JMatR..11.2257S