Two spectrometers for threshold photoelectron coincidence studies of double photoionization Hochlaf, M. ; Kjeldsen, H. ; Penent, F. ; Hall, R. I. ; Lablanquie, P. ; Lavollée, M. ; Eland, J. H. D. Abstract Publication: Canadian Journal of Physics Pub Date: November 1996 DOI: 10.1139/p96-800 Bibcode: 1996CaJPh..74..856H