Generation of degradation defects, stacking faults, and misfit dislocations in ZnSe-based films grown on GaAs
Abstract
- Publication:
-
Journal of Vacuum Science Technology B: Microelectronics and Nanometer Structures
- Pub Date:
- July 1995
- DOI:
- 10.1116/1.587880
- Bibcode:
- 1995JVSTB..13.1694K