X-ray reflectometry from samples with rough interfaces: an oxidic-multilayer study Deboer, D. K. G. ; Leenaers, A. J. G. ; Wolf, R. M. Abstract Publication: Journal of Physics D Applied Physics Pub Date: April 1995 DOI: 10.1088/0022-3727/28/4A/044 Bibcode: 1995JPhD...28..227D