Optical reading and writing on GaAs using an atomic force microscope
Abstract
Optically aided reading and writing of gold and tungsten mounds on proton-implanted, multiple quantum well InGaAs/GaAs wafers has been demonstrated using an atomic force microscope (AFM). The system is relatively simple, requiring only a diode laser as the light source, providing a novel, compact, optoelectronic memory system.
- Publication:
-
Applied Physics Letters
- Pub Date:
- May 1995
- DOI:
- 10.1063/1.113473
- Bibcode:
- 1995ApPhL..66.2780C
- Keywords:
-
- Atomic Force Microscopy;
- Electric Potential;
- Gallium Arsenides;
- Gold;
- Indium Compounds;
- Indium Gallium Arsenides;
- Semiconductors (Materials);
- Tungsten;
- Ion Irradiation;
- Lithography;
- Optoelectronic Devices;
- Quantum Wells;
- Semiconductor Lasers;
- Optics