We have evaluated several solid state detectors which offer excellent energy resolution at room temperature for soft X-rays. For soft X-rays (< 1 keV to 20 keV), silicon P-intrinsic-N (PIN) and avalanche-mode photodiodes (APD's) have been studied. Using commercially available charge sensitive pre-amplifiers, these photodiodes provide 1 keV resolution without cooling. Their detection efficiencies are limited to about 20 keV and 15 keV, respectively. To overcome this constraint, we have studied thick (1.5 mm) PIN detectors made by Micron Semiconductor Ltd., U.K., as well as compound semiconducting materials with high “Z” constituents such as CZT and PbI2. PbI2 allows high detection efficiencies of photons up to 100 keV with detectors 100 300 microns thick. These new detectors offer the capability to study the low-energy spectral evolution of Gamma ray bursts (GRBs). A matrix of these detectors could be used as an image plane detector with moderate spatial resolution for imaging.