Double-tip STM for Surface Analysis
Abstract
We explore the possibility of using a double-tip STM to probe the single electron Green function of a sample surface, and describe a few important applications: (1) Probing constant energy surfaces in $\k$-space by ballistic transport; (2) Measuring scattering phase shifts of defects; (3) Observing the transition from ballistic to diffusive transport to localization; and (4) Measuring inelastic mean free paths.
- Publication:
-
arXiv e-prints
- Pub Date:
- May 1994
- DOI:
- 10.48550/arXiv.cond-mat/9405036
- arXiv:
- arXiv:cond-mat/9405036
- Bibcode:
- 1994cond.mat..5036N
- Keywords:
-
- Condensed Matter
- E-Print:
- Minor changes, to appear in Phys.Rev.B, 12 pages + 2 figures