X-Ray Reflection from Thin Films with Rough Surfaces: Application to Kumakhov Optics.

Reflections of x-rays and neutrons from real surfaces are never perfect. Even for incident angles less than the critical angle for total external reflection, there are losses associated with absorption and roughness scattering. This dissertation calculates specular, and diffuse reflection coefficients from single rough surfaces and thin films with rough surfaces. The results presented are exact to second order in the roughness height. Kumakhov optic performance is degraded by absorption and roughness scattering. It is found that both of these effects can be decreased if the inner surfaces of the capillaries are coated with thin films of appropriate materials.