Charge Neutralization Processes Between Highly Charged Ions and Surfaces

The interaction of highly charged ions with surfaces causes the emission of secondary electrons. Measurements have been made of the electron emissions from Ag and NaCl targets, due to bombardment with multiply charge Ar ions. Ions beams that were used are Ar^{+2} , Ar^{+4}, Ar ^{+6}, Ar^{+8 }, and Ar^{+9} at 24 keV, Ar^{+4}, Ar ^{+6}, Ar^ {+8}, Ar^{+9} , and Ar^{+11} at 48 keV, and Ar^{+8}, Ar^{+9}, Ar^ {+11}, and Ar^{+13 } at 96 keV. Energy spectra of the emitted electrons reveal Ag M Augers and Ar L Augers for the silver target, and Cl L Augers and Ar L Augers (only for high charge states) for the NaCl target.