Characterization and Modeling of High Speed, High Resolution Focal Plane Arrays

The work presented in this dissertation examines the characterization and modeling of visible charge-coupled devices (CCDs). A theoretical model is discussed that represents the parallel clock register of a CCD as a lumped system of discrete resistances and capacitances. This model can be used to simulate the electrical performance of the clock register. From the simulation results the clock pulse degradation in the lossy transmission line model of the clock electrode can be determined. An upper limit is found to the parallel clock frequency at which reasonable pulse shapes are preserved. In addition, the model is used to find the current flow and the power dissipation within the clock electrodes. Through simulations, the total power dissipation on a high-speed, high-resolution CCD can be calculated and compared to theoretical values obtained from a conventional model. The experimental part of this dissertation covers the theory and application of test methodology for the characterization of high-speed, high-resolution CCDs. Both standard and novel techniques for CCD evaluation are discussed, covering all standard figures-of-merit such as read noise, full-well capacity, dynamic range, conversion gain, charge transfer efficiency, MTF, quantum efficiency, non-uniformity, dark current, linearity and lag. This chapter is followed by a discussion of the test camera hardware and software that is used to develop characterization techniques and apply them to specific devices. Finally, the characterization results from applying these techniques to the English Electric Valve (EEV) CCD13 are presented. This device is a 512 by 512 pixel, 8-output, three-phase, full-frame CCD that was designed for readout periods of less than 2 ms. It has been characterized at data rates up to 1 MHz, resulting in video acquisition of 128 by 64 pixel subarrays at 100 frames per second. The results show that both experimental characterization and theoretical modeling are two important aspects of CCD evaluation, providing necessary data to customers and valuable feedback to manufacturers.