Photoreflectance characterization of GaAs as a function of temperature, carrier concentration, and near-surface electric field
Abstract
- Publication:
-
Journal of Vacuum Science Technology B: Microelectronics and Nanometer Structures
- Pub Date:
- March 1993
- DOI:
- 10.1116/1.586698
- Bibcode:
- 1993JVSTB..11..169B