Growth-mode-specific intrinsic stress of thin silver films
Abstract
The growth and morphology of thin films are directly related to their intrinsic stress. In the system silver on mica (001) three different Vollmer-Weber-type growth modes were clearly distinguished by in situ intrinsic-stress measurements, using a very sensitive cantilever beam device. For epitaxial silver films, a stress contribution due to the formation of single crystalline domain walls is observed.
- Publication:
-
Physical Review B
- Pub Date:
- August 1991
- DOI:
- 10.1103/PhysRevB.44.3369
- Bibcode:
- 1991PhRvB..44.3369K
- Keywords:
-
- 68.55.-a;
- 62.20.-x;
- Thin film structure and morphology;
- Mechanical properties of solids