Application of SR-XFA for identification of the basic composition of high-temperature superconductors
The technique of simultaneous identification of the basic components (except for oxygen) in high-temperature superconductor (HTSC) films is described. X-ray fluorescence analysis of the films was performed using a monochromatized SR beam from the VEPP-3 storage ring. To reduce the substrate background we used the method of complete reflection of exciting radiation from the surface of a sample. The layout of the device is depicted, and first results are reported. The technique can be applied to the identification of the contents of microimpurities in films and large HTSC samples.