Residual noise in Auger suppressed photodiodes
Abstract
Auger-suppressed photodiode infrared detectors potentially suffer from noise processes associated with Shockley-Read traps. For cadmium mercury telluride, the noise intensities for Auger processes and those due to residual trap concentrations are calculated, and the influences of temperature and acceptor doping, which can be varied to yield optimum operation, are shown.
- Publication:
-
Infrared Physics
- Pub Date:
- 1991
- DOI:
- Bibcode:
- 1991InfPh..31...73D
- Keywords:
-
- Auger Effect;
- Infrared Detectors;
- Noise Reduction;
- Photodiodes;
- Temperature Effects;
- Hole Distribution (Electronics);
- Mercury Cadmium Tellurides;
- Photoconductors;
- Electronics and Electrical Engineering