Contrast and sensitivity enhancement in scanning optical systems
Abstract
Two techniques representing modifications to the basic scanning optical microscopy are described: one responds primarily to amplitude, and the other images phase structures. The techniques are based on differential and linear imaging concepts allowing for substantial enhancements in contrast and sensitivity. It is shown that the use of amplitude for imaging can be as effective as that of phase, and the choice would be a function of the object under examination. The methods offer comparable sensitivity to variations across samples, approaching 1 part in a million, in detecting reflectivity variations, and about 3 microradians in phase changes, both in a 1-kHz bandwidth.
- Publication:
-
Lasers 1989
- Pub Date:
- 1990
- Bibcode:
- 1990lase.conf..972S
- Keywords:
-
- Image Processing;
- Nondestructive Tests;
- Optical Microscopes;
- Optical Scanners;
- Phase Contrast;
- Electro-Optics;
- Image Contrast;
- Optical Polarization;
- Signal To Noise Ratios;
- Instrumentation and Photography