Automatic tools for microprocessor failure analysis
Abstract
A new approach for fault location when testing microprocessors is presented. The startpoint for the backtracing analysis converging to the failure is constituted by the automatic localization of a reduced area. Automatic image comparison based on pattern recognition is performed by means of an electron beam tester. The developed hardware and software tools allow large circuit areas to be covered offering powerful diagnosis capabilities to the user. The validation of this technique was performed on faulty 68000 microprocessors. It shows the feasibility of the automation of the first and most important step of failure analysis: fault location at the chip surface.
- Publication:
-
Institut National Polytechnique, Test and Diagnosis of Programmable Integrated Circuits
- Pub Date:
- 1990
- Bibcode:
- 1990inpt.rept..195C
- Keywords:
-
- Automatic Control;
- Circuits;
- Control Systems Design;
- Failure Analysis;
- Feasibility Analysis;
- Microprocessors;
- Chips (Electronics);
- Comparison;
- Computer Techniques;
- Electron Beams;
- Pattern Recognition;
- Position (Location);
- Electronics and Electrical Engineering