A method and tools for microprocessor validation: High safety function applications
Abstract
An approach to state functional diagnosis when testing complex circuits is presented. This approach can lead in some cases, to low level fault localization. A priori and a posteriori hypotheses are developed. Experimental results are given. The 80C86 microprocessor characteristics are described, as well as test programs characteristics for 80C86 microprocessor, as generated by GAPT (French acronym for automatic generation of programs). The approach may be used to validate circuits for highly secure or highly reliable applications.
- Publication:
-
Institut National Polytechnique, Test and Diagnosis of Programmable Integrated Circuits
- Pub Date:
- 1990
- Bibcode:
- 1990inpt.rept..177V
- Keywords:
-
- Automatic Test Equipment;
- Complex Systems;
- Computer Systems Performance;
- Integrated Circuits;
- Microprocessors;
- Performance Tests;
- Proving;
- Software Tools;
- Computer Programs;
- Failure Analysis;
- Position (Location);
- Electronics and Electrical Engineering