Fault localization when testing complex circuits
Abstract
An approach to state functional diagnoses when testing complex integrated circuits is presented. The test environment is described. The tester is monitored by a computer which manages test sequencing. The test programs produced by the GAPT (French acronym for automatic generation of test programs) generators may be used to state a functional diagnosis, when testing microprocessors. In some cases, it may help in finding design or manufacturing faults. The test programs generated by GAPT are used as go/no go test programs. Significant experiments, using the so called a posteriori approach were carried out, with regard to simple testing and design validation of a second source 68000, with a view to comparing the second source circuit with the original one. The test system is currently used to test a sample of Intel 8086 microprocessors, which will be implemented in a space environment.
- Publication:
-
Institut National Polytechnique, Test and Diagnosis of Programmable Integrated Circuits
- Pub Date:
- 1990
- Bibcode:
- 1990inpt.rept..153V
- Keywords:
-
- Complex Systems;
- Computer Systems Performance;
- Failure Analysis;
- Fault Tolerance;
- Integrated Circuits;
- Position (Location);
- Computer Networks;
- Computer Programs;
- Diagnosis;
- Microprocessors;
- Sequencing;
- State Estimation;
- Electronics and Electrical Engineering