A comparative study between a structural test and three functional test methods is presented. The three functional test methods are a tailored test, a systematic pseudo exhaustive test, and a random test. Test equipment is described. The results of the performed experiments are given. It is shown that the structural test, which takes advantage of all the knowledge acquired during microprocessor 68000 life is efficient. The random test method achieves a hundred percent boolean defect coverage at the cost of a very long test length. Random tests seem to achieve an impressive fault coverage and must be the subject of further studies.
Institut National Polytechnique, Test and Diagnosis of Programmable Integrated Circuits
- Pub Date:
- Failure Analysis;
- Functional Analysis;
- Boolean Functions;
- Random Processes;
- Electronics and Electrical Engineering