A number of functional level test approaches were proposed for microprocessors. The pragmatic GAPT (French acronym for automatic generation of test programs) approach is supported by a set of tools and experimental results. The GAPT test program generator and the TEMAC test environment are described. The original features of the TEMAC tester makes it a unique tool for the functional test and diagnosis of programmable circuits. The experiments performed, their goals, the test environments used, and the results obtained for each test area, are presented. The failed circuit analysis is reported. Conclusions are tentatively drawn, with respect to the efficiency and scope of the functional test generation methods.
Institut National Polytechnique, Test and Diagnosis of Programmable Integrated Circuits
- Pub Date:
- Complex Systems;
- Failure Analysis;
- Very Large Scale Integration;
- Functional Analysis;
- Electronics and Electrical Engineering