The author addresses calibration issues of next-generation downsized instrumentation, pointing out that enhancements to traditional calibration techniques need to be investigated and pursued. Hardware and software enhancements to the VXIbus are considered. It is noted in particular that the advent of application-specific integrated circuit technology has allowed the downsizing of conventional test equipment as a first step. But if the ability of an instrument to measure a specified quantity is only as good as how well it is calibrated, then the issue of instrument calibration is one which must be addressed with the same vitality as the initial emphasis on standardizing instrument downsizing.
AUTOTESTCON '90; IEEE Systems Readiness Technology Conference
- Pub Date:
- Automatic Test Equipment;
- Application Specific Integrated Circuits;
- Software Tools;
- Instrumentation and Photography